{"id":15076,"date":"2022-09-08T10:03:36","date_gmt":"2022-09-08T10:03:36","guid":{"rendered":"http:\/\/45.119.114.148\/iisernew\/?p=15076"},"modified":"2022-09-08T10:03:36","modified_gmt":"2022-09-08T10:03:36","slug":"atomic-force-microscopy-afm-park-systems-nx-10","status":"publish","type":"post","link":"https:\/\/iiser.ntc-us.com\/iisernew\/atomic-force-microscopy-afm-park-systems-nx-10\/","title":{"rendered":"Atomic force microscopy (AFM) : Park Systems &#8211; NX 10"},"content":{"rendered":"<p>Measures the topographic image with resolution on the order of fractions of nanometers with low noise Z detector.<br \/>\nThe NX10 AFM is equipped with a variety of imaging modes which include:<br \/>\nStandard modes:<br \/>\nContact and LFM<br \/>\nTapping mode<br \/>\nNon-Contact AFM<br \/>\nMagnetic Force Microscopy<br \/>\nScanning Ion Conductance Microscopy (SICM)<br \/>\nElectrical measurements: Electrostatic Force Microscopy<br \/>\nFaculty Incharge: Dr. Ashwani Sharma <\/p>\n","protected":false},"excerpt":{"rendered":"<p>Measures the topographic image with resolution on the order of fractions of nanometers with low noise Z detector. The NX10 AFM is equipped with a variety of imaging modes which include: Standard modes: Contact and LFM Tapping mode Non-Contact AFM Magnetic Force Microscopy Scanning Ion Conductance Microscopy (SICM) Electrical measurements: Electrostatic Force Microscopy Faculty Incharge:&hellip; <a class=\"more-link\" href=\"https:\/\/iiser.ntc-us.com\/iisernew\/atomic-force-microscopy-afm-park-systems-nx-10\/\">Continue reading <span class=\"screen-reader-text\">Atomic force microscopy (AFM) : Park Systems &#8211; NX 10<\/span><\/a><\/p>\n","protected":false},"author":8,"featured_media":15077,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_expiration-date-status":"","_expiration-date":0,"_expiration-date-type":"","_expiration-date-categories":[],"_expiration-date-options":[]},"categories":[22,41],"tags":[],"acf":[],"_links":{"self":[{"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/posts\/15076"}],"collection":[{"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/users\/8"}],"replies":[{"embeddable":true,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/comments?post=15076"}],"version-history":[{"count":1,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/posts\/15076\/revisions"}],"predecessor-version":[{"id":15078,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/posts\/15076\/revisions\/15078"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/media\/15077"}],"wp:attachment":[{"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/media?parent=15076"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/categories?post=15076"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iiser.ntc-us.com\/iisernew\/wp-json\/wp\/v2\/tags?post=15076"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}